ENMP516-17B (HAM)

Materials Characterisation

15 Points

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Faculty of Science and Engineering
Te Mātauranga Pūtaiao me te Pūkaha
School of Engineering

Staff

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Convenor(s)

Leandro Bolzoni

Leandro Bolzoni
9381
LSL.1.20
To be advised
leandro.bolzoni@waikato.ac.nz

Lecturer(s)

Kim Pickering

Kim Pickering
4672
EF.2.01
To be advised
kim.pickering@waikato.ac.nz

Rob Torrens

Rob Torrens
4684
LSL.G.32
Appointments are best arranged in advance via email.
rob.torrens@waikato.ac.nz

Administrator(s)

: mary.dalbeth@waikato.ac.nz

Placement Coordinator(s)

Tutor(s)

Student Representative(s)

Lab Technician(s)

Librarian(s)

: cheryl.ward@waikato.ac.nz

You can contact staff by:

  • Calling +64 7 838 4466 select option 1, then enter the extension.
  • Extensions starting with 4, 5 or 9 can also be direct dialled:
    • For extensions starting with 4: dial +64 7 838 extension.
    • For extensions starting with 5: dial +64 7 858 extension.
    • For extensions starting with 9: dial +64 7 837 extension.
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Paper Description

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This 15 points paper covers the basic theory and use of advanced analytical techniques used in materials characterization using optical microscopy, x-ray diffraction, scanning electron microscopy (SEM), transmission electron microscopy (TEM) and differential thermal analysis (DTA).

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Paper Structure

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This paper is taught by directed study and coursework exercises. There are no formal lectures.
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Learning Outcomes

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Students who successfully complete the course should be able to:

  • Comprehend the underlying principles of optical microscopy for its use in the field of materials science.
    Linked to the following assessments:
  • Evaluate the results obtained via scanning electron microscopy (SEM) and the associated Energy Dispersive X-ray analysis (EDX) as per their respective operating principles.
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  • Analyse XRD spectra on the base of the theory supporting XRD analysis.
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  • Comprehend the principles and theory of differential thermal analysis (DTA) and interpret typical data from this technique.
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  • Analyse TEM data and evaluate the results obtained depending on the TEM operation mode.
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Assessment

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80% - final examination

20% - Four coursework assignments.

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Assessment Components

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The internal assessment/exam ratio (as stated in the University Calendar) is 1:4. There is no final exam. The final exam makes up 80% of the overall mark.

The internal assessment/exam ratio (as stated in the University Calendar) is 1:4 or 0:0, whichever is more favourable for the student. The final exam makes up either 80% or 0% of the overall mark.

Component DescriptionDue Date TimePercentage of overall markSubmission MethodCompulsory
1. Four coursework assignments
20
2. Exam
80
✔
Assessment Total:     100    
Failing to complete a compulsory assessment component of a paper will result in an IC grade
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Required and Recommended Readings

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Recommended Readings

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Recommended Course Books

Field guide to microscopy, Tkaczyk, Tomasz S (2010)

Principles and techniques of scanning electron microscopy, Hayat, M. A (1974)

Transmission electron microscopy: a textbook for materials science, Williams, David B; Carter, C. Barry (1996)

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Online Support

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Information regarding online support/Moodle will be provided by the lecturers concerned.

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Workload

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This paper will be delivered by directed study and course work for a total of 150 hours between contact hours and independent study.
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Linkages to Other Papers

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Prerequisite(s)

ENMP211

Corequisite(s)

Equivalent(s)

Restriction(s)

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